Oxford Instruments’ nanoanalytical products offer state-of-the-art tools for material characterisation down to the nanometre scale.
The EDX detectors are used in electron microscopes (SEM and TEM) as well as ion beam systems (FIB) and are employed in research and development across a wide range of academic and industrial applications, including semiconductors, renewable energy, mining, metallurgy and forensics.
The product range offers an entry point into the world of EDX with the Xplore, which provides good value for money, whilst the UltimMax and UltimExtreme enable specific configurations for high-end applications. Not to be forgotten is the Unity BEX detector, which delivers unrivalled speeds and opens up new horizons for EDX in electron microscopy.
