Xplore

Xplore

The Xplore EDS detector from Oxford Instruments has been developed for energy-dispersive X-ray spectroscopy (EDS/EDX) in a scanning electron microscope (SEM). It enables the rapid identification and quantitative analysis of chemical elements in a wide variety of materials. This compact detector system is particularly well-suited to routine analyses in materials science, industrial quality control and failure analysis.

Xplore utilises the tried-and-tested detector technology of the Ultim Max Infinity series and combines a high count rate with precise elemental analysis. With sensor areas of 15, 30 or 65 mm² and a guaranteed energy resolution of less than 129 eV at Mn Kα and 100,000 cps, the system enables reliable measurements even at high count rates. Count rates of over one million cps are supported for EDS mapping.

In combination with the AZtecLive software, Xplore enables real-time chemical imaging. Element distributions and sample structures can be displayed simultaneously, allowing different material phases, coatings and impurities to be localised more quickly. The compact design also facilitates integration into scanning electron microscopes with limited space.

• EDS/EDX detector for qualitative and quantitative elemental analysis in the SEM
• Sensor areas of 15, 30 and 65 mm²
• Guaranteed energy resolution of less than 129 eV at Mn Kα and 100,000 cps
• EDS mapping with count rates exceeding 1,000,000 cps
• Real-time chemical imaging with AZtecLive
• Compact design for research, quality control and failure analysis