Unity BEX
Unity BEX
The Oxford Instruments Unity BEX combines backscattered electron (BSE) and X-ray analysis in a single detector. This allows the microstructure and elemental composition to be visualised simultaneously and directly within the scanning electron microscope (SEM).
The high X-ray sensitivity and fast data acquisition enable efficient elemental analysis – even with rough, unpolished or challenging samples. Unity BEX is ideally suited for materials science, metallurgy, geology, semiconductors, battery materials and research.
- Simultaneous BSE and X-ray analysis
- Fast element mapping
- High X-ray sensitivity
- Reduced shadowing with difficult samples
- Analysis at low beam currents
- Integration with Oxford Instruments AZtec
Related webinar:
Find out more about the Unity BEX detector and the combination of backscattered electron and X-ray imaging in the webinar hosted by our partner, Oxford Instruments. The webinar will cover how the technology works, the benefits of BEX technology and practical examples of its application.
Frequently Asked Questions
What is the advantage over traditional EDS?
Elemental information can be captured whilst SEM imaging is taking place. This makes it possible to identify areas of interest more quickly and analyse them in a targeted manner.
What types of samples is Unity BEX suitable for?
Unity is suitable for, amongst other things, metals, minerals, semiconductors, battery materials and rough or unpolished samples.
Can Unity BEX be integrated into existing SEM systems?
Compatibility depends on the specific microscope and its configuration. We would be happy to assist you in selecting and integrating the right system.
BEX technology with Unity
Find out more about BEX. The video demonstrates how BEX technology enhances SEM analysis by combining electron and X-ray information. Discover the possibilities offered by the Unity BEX detector for fast, high-resolution material analysis.
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